新模塊在自動(dòng)化測(cè)試應(yīng)用中傳遞了用于高帶寬測(cè)量的最優(yōu)化性能。 2008年7月28日消息，NI于當(dāng)天宣布PXI-5154數(shù)字轉(zhuǎn)換器/基于PC的示波鏡，使家族產(chǎn)品的高速高清晰度高信道產(chǎn)品增加至20種。雙信道的1 GHz PXI-5154數(shù)字轉(zhuǎn)化器提供高達(dá)2 GS/s的實(shí)時(shí)采樣率（對(duì)于重復(fù)信號(hào)采樣率為20GS/s），使其成為獲得和描述快速、十億分之一秒速度的理想選擇。每個(gè)頻道安裝有很大的車載內(nèi)存，可達(dá)256MB，數(shù)字轉(zhuǎn)換器還可提供高持續(xù)不變的采樣率，擴(kuò)大數(shù)據(jù)捕捉窗口。設(shè)備非常適用于在消費(fèi)類電子、半導(dǎo)體、航空防御和生命科學(xué)行業(yè)的自動(dòng)化測(cè)試和數(shù)據(jù)流應(yīng)用。 利用NI獲專利的T-Clock技術(shù)，工程師們可將PXI數(shù)字轉(zhuǎn)化器與多種NI硬件相融合，定制和構(gòu)建一個(gè)完整的、自動(dòng)化的多信號(hào)測(cè)試系統(tǒng)。利用T-Clock技術(shù)，工程師們還可以同步多個(gè)PXI-5154數(shù)字轉(zhuǎn)化器，在單個(gè)PXI底盤上組建高達(dá)34信道的系統(tǒng)，各個(gè)模塊之間同步的采樣率可達(dá)1GS/s，精確度達(dá)到皮秒級(jí)。數(shù)字轉(zhuǎn)換器的高帶寬和tight 多模塊同步尤其對(duì)應(yīng)用有益，包括質(zhì)譜測(cè)量、雷達(dá)、智能信號(hào)、非破壞性測(cè)試和高信道計(jì)算的物理實(shí)驗(yàn)。 工程師們可將新數(shù)字轉(zhuǎn)化器與NI LabVIEW Express software軟件相結(jié)合，快速得到數(shù)據(jù)，執(zhí)行測(cè)量，并在Microsoft Excel中分析。此外，PXI-5154數(shù)字轉(zhuǎn)化器與所有的NI儀器想結(jié)合工作，如：LabVIEW和LabWindows/CVI及其它開發(fā)環(huán)境，如ANSIC，Microsoft C++和Visual Basic. 更多關(guān)于新數(shù)字轉(zhuǎn)化器信息，可登陸visit www.ni.com/digitizers 查看。 [font=times]original text [/font] [font=times]

National Instruments Introduces 1 GHz Bandwidth PXI Digitizer

[/font] [font=times][color=#708090]New Module Delivers Optimized Performance for High-Bandwidth Measurements in Automated Test Applications NEWS RELEASE – July 28, 2008 – National Instruments today announced a significant bandwidth increase in its digitizer offering with the introduction of the NI PXI-5154 digitizer/PC-based oscilloscope, expanding the family of more than 20 high-speed, high-resolution and high-channel-count products. The dual-channel, 1 GHz PXI-5154 digitizer offers up to a 2 GS/s real-time sample rate （20 GS/s equivalent-time sample rate for repetitive signals）, making it ideal for acquisition and characterization of fast, nanosecond-edge speeds. Equipped with the deepest onboard memory in its class of up to 256 MB per channel, the digitizer also provides high sustained sample rates over extended data capture windows. The device is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense and life sciences industries. Using National Instruments patented T-Clock technology, engineers can integrate PXI digitizers with a variety of NI hardware – including arbitrary waveform generators and digital waveform generators/analyzers – to customize and build a complete, automated mixed-signal test system. Using T-Clock technology, engineers also can synchronize multiple PXI-5154 digitizers to build systems with up to 34 channels in a single PXI chassis, all simultaneously sampling at 1GS/s and synchronized to picosecond-level accuracy between modules. The digitizer’s high bandwidth and tight multi-module synchronization are particularly beneficial for applications including mass spectrometry, radar, signal intelligence, non-destructive test and high-channel count physics experimentation. Engineers can combine the new digitizer with NI LabVIEW Signal Express software to quickly acquire data, perform measurements, and view and analyze data in Microsoft Excel. Additionally, the PXI-5154 digitizer works with all National Instruments software including LabVIEW and LabWindows?/CVI as well as other development environments such as ANSI C, Microsoft C++ and Visual Basic. For more information on the new digitizer, readers can visit www.ni.com/digitizers.[/color][/font]