2007年3月27日消息，NI（美國國家儀器有限公司）舉辦了每年一屆的第四屆自動(dòng)化測試巔會(huì)，此次測試的特色是集中鑒別和克服新挑戰(zhàn)上。2007自動(dòng)化測試巔會(huì)將于5月8日在網(wǎng)上實(shí)況轉(zhuǎn)播，持續(xù)90天。在免費(fèi)一日行活動(dòng)中，參加者可瀏覽主旨介紹，觀看技術(shù)會(huì)議、參與直播討論和在展區(qū)與賣主間的互動(dòng)活動(dòng)。 “NI每年都要與行業(yè)技術(shù)領(lǐng)先企業(yè)和ATE提供商共同主辦自動(dòng)化測試巔會(huì)，向來自不同的電子技術(shù)領(lǐng)先制造商們的測試工程師和測試經(jīng)理展示解決測試難題的最新測試策略和技術(shù)”NI自動(dòng)化測試產(chǎn)品經(jīng)理Kevin Bisking說，“為了使巔會(huì)讓工程師們?nèi)菀渍莆諟y試方法來面對(duì)增長的工作量，NI將在網(wǎng)上舉辦今年的測試巔會(huì)。工程師們可以根據(jù)方便自己的方法學(xué)到最優(yōu)的測試方法” 來自公司的代表們，如微軟、英特爾、泰克（Tektronix）、Averna和BAE Systems將在活動(dòng)舉行期間分享他們的專業(yè)技術(shù)和最優(yōu)方法。NI業(yè)務(wù)和技術(shù)伙伴Mike Santori將參加主旨為“研發(fā)下一代測試系統(tǒng)”的測試。德州儀器自動(dòng)化基礎(chǔ)設(shè)施經(jīng)理Marvin Landrum，將參加下午的主旨為“發(fā)展全球測試程序戰(zhàn)略”。技術(shù)途徑包括下主題： 通過向普通測試系統(tǒng)架構(gòu)轉(zhuǎn)移降低成本 通過下一代技術(shù)改良系統(tǒng)性能 發(fā)展全球化測試程序戰(zhàn)略 參考者可登錄https://events.unisfair.com/index.jsp?code=press&seid=4&eid=177.在線注冊(cè) 關(guān)于NI NI虛擬儀器領(lǐng)域的技術(shù)先驅(qū)和領(lǐng)導(dǎo)者。一個(gè)革新的觀念已經(jīng)改變了工程師和科學(xué)家們?cè)诠I(yè)、政治和學(xué)術(shù)領(lǐng)域關(guān)于測量和自動(dòng)化的模式。 NI總部位于德州Austin，擁有員工3,900多名分布在40多個(gè)國家。2005年，公司賣出的產(chǎn)品遍及90個(gè)國家的25,000公司。 original text [COLOR=#708090][b]National Instruments Hosts Automated Test Summit 2007 Industry-Leading Companies to Share Best Practices on Automated Test Design at Online Event[/b] NEWS RELEASE – March 27, 2007 – National Instruments is hosting the fourth annual Automated Test Summit, featuring technical sessions focused on identifying trends and overcoming new challenges in automated test. The Automated Test Summit 2007 will be hosted live on the Internet May 8, and will be available on demand for 90 days. At the free full-day event, attendees can view keynote presentations, watch technical sessions, participate in live Q&A forums and interact with vendors in the exhibitor area. “National Instruments works with technology leaders and ATE suppliers every year to host the Automated Test Summit, which presents the latest test strategies and technologies addressing challenges faced by test engineers and senior managers from leading electronics manufacturers,” said Kevin Bisking, NI automated test product manager. “To make the summit more accessible to engineers facing increased workloads, NI is hosting the event online this year. Engineers will be able to learn the best practices in test development at their convenience.” Representatives from companies such as Microsoft, Intel, Tektronix, Averna and BAE Systems will share their technical expertise and best practices during the event. NI Business and Technology Fellow Mike Santori will present the keynote "Developing Next-Generation Test Systems." Marvin Landrum, automation infrastructure manager at Texas Instruments, will present the afternoon keynote “Strategies for Developing a Global Test Program.” Technical tracks feature the following topics: -Reducing cost by migrating to a common test system architecture -Improving system performance with next-generation technologies -Strategies for developing a global test program -Best practices for incorporating new measurements into a test system Participants can register online and find a full list of technical sessions at https://events.unisfair.com/index.jsp?code=press&seid=4&eid=177 [/COLOR]